Dresden 2006 – scientific programme

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CPP: Chemische Physik und Polymerphysik

CPP 13: POSTER New Experimental Techniques

CPP 13.9: Poster

Tuesday, March 28, 2006, 17:00–19:00, P3

Imaging of surface and in depth modification of Polybutadiene (PBD) and silane-linked Polyethylenimine (PEI) films — •Martin Michelswirth¹, Thorsten Andres¹, Thorsten Meyer², Bernd Zimmermann², Manfred Neumann², and Ulrich Heinzmann¹ — ¹Molekül- und Oberflächenphysik, Fakultät für Physik, Universität Bielefeld — ²Elektronenspektroskopie, Fachbereich Physik, Universität Osnabrück

We present the characterization of surface-structured thin Polybutadiene (PBD) and Polyethylenimine (PEI) films by Atomic Force Microscopy (AFM) and Imaging Ellipsometry. The surfaces of those 70 nm thin films were modified by a plasma modification process, using square meshes as "in contact masks". To investigate the resulting structures we performed AFM and Imaging Ellipsometry. In contrast to AFM, Imaging Ellipsometry enabled imaging of "in depth" modifications of our surface structures. Such "in depth" modifications were also investigated in branched and unbranched silane-linked organic layers of PEI. Additionally both the PBD and PEI films have been characterized by X-Ray Photoelectron Spectroscopy (XPS). The experimental results will be presented in detail.