Dresden 2006 – scientific programme
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CPP: Chemische Physik und Polymerphysik
CPP 23: POSTER Functional Organic Thin Films
CPP 23.1: Poster
Thursday, March 30, 2006, 17:00–19:00, P2
Watching organic semiconductors grow: In-situ and real-time spectroscopic ellipsometry — •S. Kowarik1,2, U. Heinemeyer1, G. Humphreys2, R. Jacobs2, A. Gerlach1,2, and F. Schreiber1 — 1Institut für Angewandte Physik, Universität Tübingen, Auf der Morgenstelle 10, 72076 Tübingen — 2Physical and Theoretical Chemistry Laboratories, Oxford University, South Parks Road Oxford OX1 3QZ
Thin films of organic semiconductors and dyes are receiving significant attention, and their potential for electronic and optoelectronic device applications is obvious. Optimisation of device performance requires the understanding of the underlying preparation procedures. For this purpose real-time measurements are particularly powerful since they detect possible changes in the functional properties already during growth. We demonstrate the use of spectroscopic ellipsometry as a non-invasive technique for following diindenoperylene and pentacene growth in situ and in real time. It is possible to take spectra in the entire spectral range between 1.25eV and 5 eV sufficiently fast to follow organic molecular beam deposition in detail. We show how this technique can be used to detect spectral changes occurring during growth of these complex materials.