Dresden 2006 – scientific programme

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CPP: Chemische Physik und Polymerphysik

CPP 27: POSTER Polymer Physics and Materials

CPP 27.24: Poster

Thursday, March 30, 2006, 17:00–19:00, P2

A Scanning Probe Microscope (SPM) with quasi in-situ Sample Treatment Capabilities: Solvent vapor treatment of thin polymer films in the presence of high electric fields — •Violetta Olszowka, Markus Hund, Larisa Tsarkova, Alexander Böker, and Georg Krausch — Physikalische Chemie II, Universität Bayreuth, D-95440 Bayreuth

We have investigated a block copolymer thin film undergoing treatments with solvent vapor and high homogenous electric fields (E-fields, ≈40V/µ m). E-fields can be used to control the domain orientation which in turn ends to an important role in fabricating and controlling nanostructures. Due to the high electric field it is not possible to perform in-situ scanning. The E-field would produce SPM image artifacts caused by additional electrostatic forces between tip and sample. Moreover the applied high voltage could destroy the microscope by flashovers and could damage the scanner. Performing the sample treatments ‘ex situ’ would require time-consuming re-positioning protocols. We therefore have adapted an SPM with advanced quasi in-situ sample treatment capabilities to effectively study the influences of high electric fields on block copolymer films exposed to a controlled solvent vapor atmosphere.