Bereiche | Tage | Auswahl | Suche | Downloads | Hilfe
CPP: Chemische Physik und Polymerphysik
CPP 27: POSTER Polymer Physics and Materials
CPP 27.2: Poster
Donnerstag, 30. März 2006, 17:00–19:00, P2
IR-VIS Ellipsometry for characterization of ultra-thin polymer films — •K. Hinrichs1, M. Gensch1, N. Esser1, L. Ionov2, M. Stamm2, S. Minko3, and K.-J. Eichhorn2 — 1ISAS - Institute for Analytical Sciences, Department Berlin, — 2Leibniz Institute for Polymer Research Dresden, Hohe Str. 6, D-01069 Dresden — 3Chemistry Department, Clarkson University, Potsdam, New York 13699, USA
Mid infrared (MIR) spectroscopic ellipsometry [1] and Visible (VIS) ellipsometry have been jointly used for the study of mixed polystyrene-poly(2-vinylpyridine) and polystyrene-poly(ter-butyl acrylate) polymer grafted films (mixed brushes) with gradually changing composition (1D gradient mixed brushes). In the first step from ellipsometric measurements the optical constants of the single polymers in thin films (PS, P2VP, PBA) have been evaluated. In a second step the thickness and composition of mixed polymer brush films (d<10nm) of these compounds were determined. It is evident that infrared optical properties of polymer thin films are correlated to the chemical structure of the thin film and can be used for lateral compositional analysis, whereas conventional VIS ellipsometry is limited by the similarity of refractive indices of different polymers. Present limitations of IRSE are due to the signal to noise ratio and restricted lateral resolution. This can be improved at the synchrotron ellipsometer at BESSY/Berlin, which is presently upgraded for mapping experiments.
[1] K. Hinrichs, M. Gensch, N. Esser, Appl. Spectrosc. 59 (2005) 272(A)-282(A). [2] L. Ionov, A. Sidorenko, K.-J. Eichhorn, M. Stamm, S. Minko, K. Hinrichs, Langmuir 21 (2005) 8711.