Dresden 2006 – scientific programme

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CPP: Chemische Physik und Polymerphysik

CPP 27: POSTER Polymer Physics and Materials

CPP 27.45: Poster

Thursday, March 30, 2006, 17:00–19:00, P2

Crystallization/melting transition of polymer thin films probed by ellipsometry — •Christa H.M. Weber, Adriana M. Mihut, Sven Hüttner, Arnaud Chiche, and Georg Krausch — Physikalische Chemie II, Universität Bayreuth, 95440 Bayreuth

Ellipsometry has been used to investigate crystallization and melting of thin polymer films. This technique is sensitive to the sharp changes in film density and thickness that occur during these transitions. As a result, precise melting and crystallization points can be measured in-situ during thermal or solvent vapor treatments. We present example studies of model crystalline polymers and block copolymers thin films.