DS 10: Thin organic films I
Tuesday, March 28, 2006, 09:30–11:00, GER 38
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09:30 |
DS 10.1 |
Application of infrared spectroscopic ellipsometry in studies of electrochemically grafted thin organic monolayers — •K. Roodenko, J. Rappich, R. Hunger, M. Gensch, A.G. Güell, Th. Dittrich, A. Merson, Y. Shapira, N. Esser, and K. Hinrichs
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09:45 |
DS 10.2 |
Systematic trends in the surface roughness of organic films — •Phenwisa Niyamakom, Maryam Beigmohamadi, Azadeh Farahzadi, Stephan Kremers, Thomas Michely, and Matthias Wuttig
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10:00 |
DS 10.3 |
XANES and resonant Auger measurements of benzo-annelated Copper Porphyrazine molecules — •D. R. Batchelor, D. Pop, A. Schöll , S. Kera , B. Winter , W. Freyer , and E. Umbach
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10:15 |
DS 10.4 |
Molecular Orientation of ZnPc grown on Silicon(111) Substrates and its Influence on the Optical Constants. — •Sindu John Louis, Daniel Lehmann, Katy Roodenko, Karsten Hinrichs, Norbert Esser, Marion Friedrich, and Dietrich R. T. Zahn
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10:30 |
DS 10.5 |
Ellipsometric Study of an Organic Template Effect — •Ovidiu D. Gordan, Takeaki Sakurai, Katsuhiro Akimoto, Marion Friedrich, and Dietrich R. T. Zahn
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10:45 |
DS 10.6 |
Real-time observation of organic semiconductor growth: Evolution of structure and surface morphology — •S. Kowarik, A. Gerlach, S. Sellner, F. Schreiber, J. Pflaum, L. Cavalcanti, and O. Konovalov
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