Dresden 2006 – wissenschaftliches Programm
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DS: Dünne Schichten
DS 24: Poster presentation
DS 24.6: Poster
Dienstag, 28. März 2006, 15:00–17:30, P2
Growth of axially textured Bismuth layers on amorphous substrates — •Christian Patzig1, Ingo Uschmann2, Frank Schmidl1, Ortrud Wehrhan2, Matthias Grube1, and Paul Seidel1 — 1Institut für Festkörperphysik, Friedrich-Schiller-Universität Jena, Helmholtzweg 5, 07743 Jena, Germany — 2Institut für Optik und Quantenelektronik, Friedrich-Schiller-Universität Jena, Max-Wien-Platz 1, 07743 Jena, Germany
The growth of thin bismuth layers on floatglas was investigated. Thermal evaporation and Pulsed Laser Deposition (PLD) were used as deposition techniques, and X-ray diffraction by means of the Bragg-Brentano- geometry was used to investigate the crystalline structure of the layers. It could be observed that the evaporated layers show an out-of-plane - texture, in contrast to the layers grown on glas by using PLD, which in general are of polycristalline nature. The layers deposited by thermal evaporation show the c-axis as preferred direction of growth. By deposition of a thin evaporated seed layer followed by PLD, homoepitaxy could be induced, leading to a reduction of the FWHM of the rocking curves of the (003) - and respectively (006) - peak, depending on layer thickness and substrate temperature. It was possible to grow layers with an FWHM (003) < 1∘ on amorphous floatglas. Possible applications of those layers are discussed.