Dresden 2006 – scientific programme
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DS: Dünne Schichten
DS 24: Poster presentation
DS 24.73: Poster
Tuesday, March 28, 2006, 15:00–17:30, P2
Properties of multiferroic BiFeO3 thin films grown by pulsed laser deposition — •Patrick Schützendorf1, Regina Dittmann1, Bernd Holländer2, Hermann Kohlstedt1, and Rainer Waser1 — 1Institut für Festkörperforschung, Forschungszentrum Jülich GmbH, D- 52425 Jülich — 2Institut für Schichten und Grenzflächen, Forschungszentrum Jülich GmbH, D- 52425 Jülich
Thin films of the multiferroic material BiFeO3 (BFO) exhibit huge remnant polarization values up to 150µC/cm2 [1]. The maximum polarization is obtained for the (111) orientation with the polarization being up to twice as large as the polarization along the (100) axis [2].
To further investigate the different polarization directions, we have grown BFO thin films on SrRuO3 buffered STO(100) and STO(111) substrates by PLD. The influence of the deposition conditions on the growth of BFO thin films was investigated using XRD, AFM, RBS and TEM.
Below the decomposition temperature of about 800∘C, between 700∘C and 650∘C we obtained (111) and (100) oriented films for (111) and (100) oriented substrates, respectively. We achieved rocking curves widths of about 0.11∘. For 600∘C a second phase was observed in BFO thin films grown on (100) substrates. For (111) oriented films we obtained a surface roughness of about 7 nm whereas for (100) oriented films a surface roughness of about 0.25 nm could be achieved.
We will present the electrical behaviour of the BFO thin films as a function of deposition conditions and the orientation of the films.
[1] K.Y. Yun et al., Jpn. J. Appl. Phys. 43, L647 (2004)
[2] J. Wang, et al., Sciene 299, 1719 (2003)