DS 3: Thin film analysis I
Montag, 27. März 2006, 09:30–11:00, GER 38
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09:30 |
DS 3.1 |
Hauptvortrag:
X-ray diffraction analysis of residual stress fields in thin films - basic aspects and applications — •Christoph Genzel
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10:15 |
DS 3.2 |
In-situ Study of the Thermal Stability of Fe-Pt Multilayers — •Nikolay Zotov, Jürgen Feydt, Alan Savan, and Alfred Ludwig
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10:30 |
DS 3.3 |
Growth and roughness evolution of sputtered aluminum oxide films on organic and inorganic substrates — •S. Sellner, A. Gerlach, S. Kowarik, F. Schreiber, N. Kasper, H. Dosch, S. Meyer, J. Pflaum, and G. Ulbricht
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10:45 |
DS 3.4 |
Residual stress analysis in multilayer systems with synchrotron radiation - complementary investigations using angle and energy dispersive diffraction methods — •Manuela Klaus, Ingwer Denks, and Christoph Genzel
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