Dresden 2006 – wissenschaftliches Programm
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DS: Dünne Schichten
DS 4: Thin film analysis II
DS 4.5: Vortrag
Montag, 27. März 2006, 12:15–12:30, GER 38
Local density profiles in thin films and multilayers from diffuse x-ray and neutron scattering — •Markus Rauscher1,2, Harald Reichert1, Simon Engemann1, and Helmut Dosch1,2 — 1Max-Planck-Institut für Metallforschung, Heisenbergstr. 3, 70569 Stuttgart, Germany — 2Institut für Theoretische und Angewandte Physik, Universität Stuttgart, Pfaffenwaldring 57, 70469 Stuttgart, Germany
We develop a technique to determine local density profiles in rough thin films and multilayers for which conventional reflectometry does not work. The main idea is to integrate the total scattered intensity for a given vertical momentum transfer over the parallel momentum transfer. Probing Fourier space globally results in a local probe in real space and the integrated intensity is proportional to the local reflectivity of the surface. We also discuss the influence of a finite range of integration as well as sample inhomogeneities. This technique is limited to situations where the kinematic Born approximation is sufficient to describe the scattering process. However, in certain cases the technique can be used in the vicinity of the critical angle of total external reflection as well.