DS 4: Thin film analysis II
Monday, March 27, 2006, 11:15–12:45, GER 38
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11:15 |
DS 4.1 |
Determination of Mn valency using ELNES in the (S)TEM — •Thomas Riedl, Thomas Gemming, and Klaus Wetzig
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11:30 |
DS 4.2 |
Epitaxial anatase (012) and (001) films grown on (110) and (100) SrTiO3 — •Andriy Lotnyk, Stephan Senz, and Dietrich Hesse
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11:45 |
DS 4.3 |
Aberration correction used for interface characterisation with atomic resolution — •Meiken Falke, Andrew Bleloch, Uwe Falke, Gunter Beddies, and Steffen Teichert
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12:00 |
DS 4.4 |
Texture Characterization of Pyrolytic Carbon Layers: A Quantitative Study by Polarized Light Microscopy and Selected Area Electron Diffraction — •Andreas Pfrang, David Bach, Dagmar Gerthsen, and Thomas Schimmel
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12:15 |
DS 4.5 |
Local density profiles in thin films and multilayers from diffuse x-ray and neutron scattering — •Markus Rauscher, Harald Reichert, Simon Engemann, and Helmut Dosch
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12:30 |
DS 4.6 |
Coherence experiments with white synchrotron radiation — •Gudrun Gleber, Tobias Panzner, and Ullrich Pietsch
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