Dresden 2006 – wissenschaftliches Programm
Bereiche | Tage | Auswahl | Suche | Downloads | Hilfe
DS: Dünne Schichten
DS 6: Thin film analysis III
DS 6.1: Hauptvortrag
Montag, 27. März 2006, 14:00–14:45, GER 38
Direct observation of substrate-dependent organic layer growth — •Eberhard Umbach1, Thomas Schmidt1, Achim Schöll1, Helder Marchetto2, Hans-Joachim Freund2, and Rainer Fink3 — 1Experimental Physics II, University of Würzburg, D-97074 Würzburg, Germany — 2Fritz-Haber-Institute, Max-Planck-Gesellschaft, D-14195 Berlin, Germany — 3Physical Chemistry, University of Erlangen, D-91058 Erlangen, Germany
The growth of highly ordered or even epitaxial organic thin films on inorganic substrates very much depends on the preparation parameters like temperature and deposition rate as well as on the molecular properties, interface bonding, and substrate morphology. Various high resolution surface sensitive techniques are successfully applied to get a deeper understanding of the substrate bonding, intermolecular interaction, and electronic properties of interface and organic thin film. A novel spectro-microscope with aberration correction and energy filtering allows the direct observation of layer growth and the spectroscopic study of nano-objects like organic crystallites. With this instrument called SMART structural, chemical, and electronic properties as well as their dynamic development can be investigated with down to 2 nm spatial, < 100 meV electron energy, and 10 to 50 meV photon energy resolution. The SMART is briefly introduced, and several examples of organic layer growth are discussed. These show the transition from Stranski-Krastanov to Franck-van der Merwe growth, the influence of substrate steps and step bunches, and the dependence of the growth properties on temperature and molecule. (Funded by BMBF, contract 05KS4WWB/4)