DS 6: Thin film analysis III
Monday, March 27, 2006, 14:00–15:45, GER 38
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14:00 |
DS 6.1 |
Invited Talk:
Direct observation of substrate-dependent organic layer growth — •Eberhard Umbach, Thomas Schmidt, Achim Schöll, Helder Marchetto, Hans-Joachim Freund, and Rainer Fink
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14:45 |
DS 6.2 |
High Resolution Rutherford Backscattering Spectrometer — •Martin Schnell, Michael Uhrmacher, Carsten Ronning, and Hans Hofsäss
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15:00 |
DS 6.3 |
Ionenstrahlmikroskopische Untersuchungen an synthetischen Kylindrit-Mikrostrukturen mit hohem Aspektverhältnis und verschiedenen Grundflächen — •Christoph Meinecke, Ronny Kaden, Jürgen Vogt, Klaus Bente, and Tilman Butz
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15:15 |
DS 6.4 |
Characterization of nanostructures by conducting AFM — •Andrei Andreev, Yue Hou, and Christian Teichert
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15:30 |
DS 6.5 |
Inhomogeneities in film properties deposited in large area magnetron sputter devices — •Ronny Kleinhempel, Benjamin Graffel, Gunar Kaune, Hartmut Kupfer, Walter Hoyer, and Frank Richter
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