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Dresden 2006 – wissenschaftliches Programm

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HL: Halbleiterphysik

HL 42: Quantum dots and wires: Preparation and characterization I

HL 42.7: Vortrag

Donnerstag, 30. März 2006, 12:30–12:45, POT 51

HR-TEM characterization of InGaAs Nanowhiskers — •Daniela Sudfeld1, Jochen Kästner1, Günter Dumpich1, Ingo Regolin2, Victor Khorenko2, Werner Prost2, Franz Josef Tegude2, Stephan Lüttjohann3, Cedrik Meier3, and Axel Lorke31Departments of Physics, Experimental Physics, AG Farle, University of Duisburg-Essen, Lotharstr. 1, D-47048, Duisburg, Germany — 2Solid State Electronics Dept., University of Duisburg-Essen, Lotharstr. 55, ZHO, D-47048 Duisburg, Germany — 3Departments of Physics, Experimental Physics, University of Duisburg-Essen, Lotharstr. 1, D-47048, Duisburg, Germany

InxGa1−xAs nanowhiskers were grown by metal-organic vapour-phase epitaxy (MOVPE) on (111)B GaAs substrates using the vapour-liquid-solid growth mode. The diameter of the nanowhiskers was defined by monodisperse gold nanoparticles deposited on the GaAs substrate. The whiskers have been analyzed by high-resolution X-ray diffractometry (HR-XRD), micro-photoluminescence (µ-PL) and high-resolution transmission electron microscopy (HR-TEM) including energy-dispersive X-ray spectroscopy (EDS). This study is focussed to determine the lattice structure and the composition of the nanowhiskers. A detailed analysis of the lattice structure by high-resolved bright-field images reveal a fcc (111) phase as resulting from XRD measurements. Using the law of Vegard an indium concentration of 27.6 atom% has been determined in good agreement with our EDS-studies. In addition, EDS line scans perpendicular to the growth direction indicate a homogeneous growth and the presence of indium inside the seed gold particle.

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