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HL: Halbleiterphysik

HL 50: Poster II

HL 50.76: Poster

Donnerstag, 30. März 2006, 16:30–19:00, P3

Constant capacitance deep level transient spectroscopy on InAs quantum Dots — •Jan Schaefer, Andreas Schramm, Stephan Schulz, Christian Heyn, and Wolfgang Hansen — Institut für Angewandte Physik und Zentrum für Mikrostrukturforschung, Universität Hamburg, Jungiusstraße 11, D-20355 Hamburg, Germany

The thermionic emission of charge carriers from self-assembled quantum dots embedded in Schottky diodes is found to strongly depend on the electric field at the location of the quantum dots. So far, the emission rates have been studied with transient capacitance spectroscopy. However, in such measurements (conventional deep level transient capacitance spectroscopy, DLTS) the electric field does not remain constant while the transient is recorded. It is thus very desirable to have a method at hand, that allows to probe the carrier emission at constant field condition. Here we report about the implementation of such a method: The so-called constant capacitance deep level transient spectroscopy (CC-DLTS). We present first CC-DLTS measurements on InAs quantum dots and compare the results obtained with this and the conventional DLTS method.