Dresden 2006 – scientific programme
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MA: Magnetismus
MA 20: Poster: Films(1-36) Transp(37-56) Ex.Bias(57-67) Spindyn(68-80) Micromag(81-95) Particle(96-109) Imag.+Surface(110-113) Spinelectr(114-122) Theory+Micromag(123-131) Spinstr+Aniso(132-142) MagMat(143-156) Meas(157,158) MolMag+Kondo(159-162) Postdead(163-)
MA 20.110: Poster
Tuesday, March 28, 2006, 15:15–19:15, P1
Combined optical and force microscopy of patterned magnetic films — •Sibylle Sievers1, Martin Albrecht1, Uwe Siegner1, Sebastian Dreyer2, and Christian Jooss2 — 1Physikalisch-Technische Bundesanstalt, D-38116 Braunschweig — 2Institut für Materialphysik, Universität Göttingen, D-37077 Göttingen
A magnetic analysis of arrays of microscopic ferromagnetic elements requires characterization techniques that yield quantitative local stray field and magnetization values combined with a large-area overview. To understand the micromagnetic processes that are at the origin of the magnetic properties of individual elements, a complementary high-resolution characterization of the domain structure is required. The magneto-optical indicator film-technique (MOIF) allows for quantitative stray field imaging of individual micron sized magnetic elements and provides a large area overview of the patterned films. MOIF microscopy is combined with magnetic force microscopy (MFM), which provides domain imaging with a resolution in the sub-100-nm range. In order to demonstrate the potential of this approach, lithographically patterned L10 CoPt films with out-of-plane anisotropy were characterized. The large-scale MOIF images reveal variations among individual magnetic elements regarding the magnetic properties. The switching behaviour of single elements was characterized and remanent remagnetization curves of individual elements were determined. The respective domain structure was analyzed by MFM. The results show that magnetization reversal is governed by nucleation and growth of domains with reversed magnetization.