Dresden 2006 – scientific programme
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MA: Magnetismus
MA 20: Poster: Films(1-36) Transp(37-56) Ex.Bias(57-67) Spindyn(68-80) Micromag(81-95) Particle(96-109) Imag.+Surface(110-113) Spinelectr(114-122) Theory+Micromag(123-131) Spinstr+Aniso(132-142) MagMat(143-156) Meas(157,158) MolMag+Kondo(159-162) Postdead(163-)
MA 20.4: Poster
Tuesday, March 28, 2006, 15:15–19:15, P1
Resonant magnetic soft x-ray scattering from thin EuTe layers — •Enrico Schierle1, Eugen Weschke1, Alexander Gottberg1, Günter Kaindl1, Walter Söllinger2, and Gunther Springholz2 — 1Institut für Experimentalphysik, Freie Universität Berlin, D-14195 Berlin, Germany — 2Institut für Halbleiterphysik, Johannes Kepler University, A-4040 Linz, Austria
Magnetic structures and short-range correlations in thin EuTe(111) films [1] were studied by magnetic soft x-ray scattering at the Eu M5 resonance. The prototypical Heisenberg antiferromagnet EuTe is ideally suited for a magnetic scattering study: (i) The high magnetic sensitivity at the lanthanide M5 resonance [2] can be exploited and (ii) for the x-ray wavelength of the resonance, the magnetic signal appears exactly at the Brewster angle, which results in magnetic scattering virtually free of charge-scattering background. Magnetic diffraction provides well-resolved Laue profiles that permit a detailed reconstruction of the real-space magnetization profiles across the films, i.e. the temperature-dependent magnetization of the individual layers. The reduced values of the magnetization in the outer layers and the different temperature dependences compared to the inner layers are in good agreement with theoretical considerations. The high sensitivity of the method further permits even critical scattering studies above the ordering temperature in films with thicknesses down to 2 EuTe layers, revealing a transition to two-dimensional magnetic behavior around 3 EuTe layers.
[1] H. Kepa et al., Phys. Rev. B 68, 24419 (2003).
[2] E. Weschke et al., Phys. Rev. Lett. 93 (157204), 2004.