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MA: Magnetismus
MA 20: Poster: Films(1-36) Transp(37-56) Ex.Bias(57-67) Spindyn(68-80) Micromag(81-95) Particle(96-109) Imag.+Surface(110-113) Spinelectr(114-122) Theory+Micromag(123-131) Spinstr+Aniso(132-142) MagMat(143-156) Meas(157,158) MolMag+Kondo(159-162) Postdead(163-)
MA 20.82: Poster
Dienstag, 28. März 2006, 15:15–19:15, P1
Resonant magnetic x-ray scattering on switchable magnetic gratings patterned by keV-He-ion bombardment — •Tanja Weis1, Dieter Engel1, Arno Ehresmann1, Volker Höink2, Marc D. Sacher2, Jan Schmalhorst2, and Günter Reiss2 — 1Institute of Physics and Centre for Interdisciplinary Nanostructure Science and Technology, University of Kassel, Heinrich-Plett-Str. 40, 34132 Kassel, Germany — 2Department of Physics, University of Bielefeld, P.O. Box 100131, 33501 Bielefeld, Germany
KeV-He-ion bombardment in an external magnetic field enables the local manipulation of the exchange bias effect in ferromagnet / antiferromagnet-bilayer systems. With this technique a patterning of the magnetization direction of the ferromagnetic layer without change in surface topography is possible, the ion bombardment induced magnetic patterning (IBMP) [1,2]. These magnetic patterns (lines and squares), showing an alternating antiparallel orientation of the magnetization, were investigated with resonant magnetic x-ray scattering in remanence and in an applied magnetic field. It will be shown that these lateral magnetic patterns act as magnetically switchable reflection gratings for soft x-ray radiation.
[1] A. Mougin et.al., Phys. Rev. B, 63 (2001) 060409
[2] A. Ehresmann, Recent Res. Dev. Appl. Phys. 7 (2004) 401