Dresden 2006 – scientific programme
Parts | Days | Selection | Search | Downloads | Help
MA: Magnetismus
MA 29: Magnetic Thin Films IV
MA 29.1: Talk
Thursday, March 30, 2006, 15:15–15:30, HSZ 03
Critical Thickness and Critical Field of magnetic multilayered structures — •Hartmut Hafermann1 and Mikhail I. Katsnelson2 — 1I. Institut für Theoretische Physik, Universität Hamburg, Jungiusstraße 9, 20355 Hamburg — 2University of Nijmegen, Toernooiveld 1, NL 6525 ED Nijmegen, The Netherlands
For magnetic thin films and multilayers the phase transition from the homogeneous magnetization to the domain structure occurs at a critical thickness. For supercritical films, the phase transition occurs at a critical field applied in the film plane.
By investigating the stability conditions of a linearized Landau-Lifshitz torque equation, we are able to calculate numerically the critical thickness and critcal field for magnetic multilayered structures, consisting of alternating magnetic layers or magnetic and nonmagnetic layers. In addition we obtain information on the spin wave dispersion relation as well as the domain structure and domain period close to the phase transition.
We studied the influence of volume and surface anisotropies as well as interlayer exchange coupling between magnetic and across nonmagnetic spacer layers on the critical thickness and the critical field.