Dresden 2006 – wissenschaftliches Programm
Bereiche | Tage | Auswahl | Suche | Downloads | Hilfe
MA: Magnetismus
MA 9: Magnetic Imaging
MA 9.3: Vortrag
Montag, 27. März 2006, 15:30–15:45, HSZ 401
MFM tip calibration with structured CoPt stripes — •Silvia Sasvári1, Mario Brands2, Günther Dumpich2, Christoph Hassel2, Ulrike Wolff1, Ludwig Schultz1, and Volker Neu1 — 1IFW Dresden, P.O. Box 270116, D-01171 Dresden, Germany — 2Fachbereich Physik, Experimentalphysik, AG Farle, Universität Duisburg-Essen, 47048 Duisburg, Germany
The quantitative measurement of magnetic stray fields with Magnetic Force Microscopy (MFM) requires calibrated MFM tips. Within the point dipole model, the two describing parameters, the dipole moment of the tip and its distance δ from the tip apex, depend on the stray field geometry, which makes a characterization with well-known structures of different length scales necessary. Therefore, a systematic study has been performed on perpendicularly magnetized CoPt stripes with different width between 30 to 2200 nm. Line profiles have been scanned across the CoPt stripes in varying heights and the measured signal is compared with simulation results of the same structures. It was found that a small planar component of the tip magnetization had to be included to achieve reasonable fits. The full analysis leads to a complete description of the tip in the simple dipole model. Since these results are only valid for perpendicular field geometries and can not necessarily be generalized for arbitrary field geometries, further investigations of other magnetization structures will be necessary to achieve a complete description of the used MFM tip.