Dresden 2006 – wissenschaftliches Programm
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MM: Metall- und Materialphysik
MM 25: Poster Session
MM 25.21: Poster
Mittwoch, 29. März 2006, 15:30–17:30, P4
EBSD-study in a scanning electron microscope for the characterisation of metals with ultrafine microstructure — •M. Hockauf1, M. Hietschold2, L. Krüger1, L. W. Meyer1, and S. Schulze2 — 1Technische Universität Chemnitz, Professur Werkstoffe des Maschinenbaus — 2Technische Universität Chemnitz, Professur Analytik an Festkörperoberflächen
In recent years the treatment of light metal materials like Mg, Al, Ti and their alloys by severe plastic deformation (SPD) attracts increasing attention as innovative way to achieve ultra fine microstructures. This causes unique properties of such materials as compared with conventional ones. Electron Back Scattering Diffraction (EBSD) in the SEM is a sophisticated technique to obtain detailed microstructure information. It closes the gap between light microscopy and TEM providing crystallographic data from large areas and allowing statistics of grain orientations and boundaries. On the other hand EBSD reaches high spatial resolution and allows correlation to macroscopic properties like fatigue-, corrosion-, strength-, deformation- and fracture behaviour. We studied light metals with ultra fine grained microstructures, as produced by equal channel angular pressing (ECAP). We demonstrate the significant change of the Aluminium alloy AA6063-T6 by SPD treatment: Starting from 100 um grain size with a high fraction of high-angle grain boundaries we end up with approximately 500 nm grain size and a high fraction of low-angle boundaries. This leads to a remarkable enhancement of strength and high cycle fatigue life (HCF). Further treatment however strengthens the material while limiting the HCF.