Dresden 2006 – scientific programme

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MM: Metall- und Materialphysik

MM 25: Poster Session

MM 25.24: Poster

Wednesday, March 29, 2006, 15:30–17:30, P4

Thermal characterization of micro-structured NiTi samples by 3ω scanning thermal microscopy (SThM) — •Jürgen Gibkes¹, Mihai Chirtoc², Jean-Staphan Antoniow², Rolf Wernhardt¹, and Josef Pelzl¹ — ¹Inst. f. Experimentalphysik, Ruhr-Iuniversität Bochum, 44801 Bochum, Germany — ²LTP, UTAP, Université de Reims, BP 1039, 51687 Reims Cedex 2, France

SThMs with thermal resistance probes offer a means to measure the local thermal conductivity by modulated local heating of the sample at the probe position and detecting the response of the probe at the frequency 3ω. The capability of the technique has been thoroughly investigated on homogenous samples by different research groups. In this contribution we report on recent results from a microstructured NiTi sample. The shape memory (SM) alloy NiTi has found a variety of important applications in industry and medicine. With decreasing sizes of the SM devices new techniques for structuring and shaping have to be employed. To prepare structures in the nano- and micrometer scale the focused ion beam offers a promising tool. However regions which have been treated with the ion beams may be distorted and their properties may deviate considerably from that of the untreated areas. Apart from the thermal transport parameters the changes of the phase transformation temperature would have a considerable undesired impact on the performance of the shape memory micro device. Scanning near field techniques are most suited to study these changes on nanoscale. This work is supported by the SFB 459