Dresden 2006 – wissenschaftliches Programm

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MM: Metall- und Materialphysik

MM 30: Symposium Nano Wires (SYNW)

MM 30.4: Vortrag

Donnerstag, 30. März 2006, 11:45–12:00, IFW D

Electrical characterization of nanowires with the LEEPS microscope — •Dirk Weber, Berthold Völkel, Andre Beyer, and Armin Gölzhäuser — Physik supramolekularer Systeme, Universität Bielefeld, Universitätsstr. 25, 33615 Bielefeld

We introduce the Low Energy Electron Point Source (LEEPS) microscope as a tool for the electrical characterization of nanowires. The LEEPS microscope is a transmission electron microscope with electron energies from 20eV to 200eV. These electrons are emitted by a field emission tip with a radius in the atomic range. Because the electrons have a high spatial coherence the resulting detector image is an interference pattern which includes the structural as well as electrical and magnetic information of the object. We will present an imaging study which compares LEEPS images of metallic, semiconducting and insulating nanowires. Certain features in the image are related to the conductivity of the wire, e.g. the brightness of the wire centre in comparison to the adjacent background. In addition we measured the conductance of single nanowires by using a metallic tip as a movable electrode and the sample support as its counterpart. Length dependant measurements allowed a distinction between the wire conductance and the contact resistance.