Dresden 2006 – wissenschaftliches Programm
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O: Oberflächenphysik
O 14: Poster session I (Adsorption, Epitaxy and growth, Phase transitions, Surface reactions, Organic films, Electronic structure, Methods) (sponsored by Omicron Nanotechnology GmbH)
O 14.53: Poster
Montag, 27. März 2006, 18:00–21:00, P2
VUV-IR ellipsometry for structural characterisation of anisotropic films — •K. Hinrichs1, S. D. Silaghi2, C. Cobet1,3, N. Esser1, and D.R.T. Zahn2 — 1ISAS - Institute for Analytical Sciences, Department Berlin, Albert-Einstein-Str. 9, 12489 Berlin, Germany — 2Chemnitz University of Technology, Semiconductor Physics, 09107 Chemnitz, Germany — 3TU Berlin, Institute of Solid State Physics, Hardenbergstr. 36, 10623 Berlin, Germany
Thin films of bio-molecules and smart materials are of increasing interest in the field of nanotechnology and the design of bio-sensors or new types of electronic and optoelectronic devices. Further advancement in these fields requires detailed understanding of structural properties of such thin films and interfaces. This contribution presents the high potential of ellipsometry for the investigation of composition and molecular structure in thin anisotropic bio-films using the VUV - IR spectroscopic ellipsometry [1,2]. Infrared and VUV optical properties of thin films are correlated to vibrational and electronic excitations. Therefore the corresponding spectra are well suited for structural analysis, while the application of VIS ellipsometry for this purpose is often limited by the similarity of refractive indices for many organic materials. In particular for the investigated films of four different DNA bases the dielectric functions were determined and interpreted with respect to the average orientation of molecules. [1] K. Hinrichs, M. Gensch, N. Esser, Appl. Spectrosc. 59 (2005) 272(A)-282(A). [2] K. Hinrichs, S. D. Silaghi, C. Cobet, N. Esser and D. R. T. Zahn, phys. stat. sol. b 242 (2005) 2681.