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O: Oberflächenphysik

O 14: Poster session I (Adsorption, Epitaxy and growth, Phase transitions, Surface reactions, Organic films, Electronic structure, Methods) (sponsored by Omicron Nanotechnology GmbH)

O 14.74: Poster

Montag, 27. März 2006, 18:00–21:00, P2

Theoretical and experimental approaches to the characterization of reflective nano-focusing photon sieves — •Dirk Rahn, Jan Bartussek, Christian Hamann, Jens Buck, Matthias Kalläne, Sönke Harm, Kai Rossnagel, and Lutz Kipp — Institut für Experimentelle und Angewandte Physik, Universität Kiel, D-24098, Germany

For many applications, such as nonospectroscopy at modern light sources, it is necessary to focus synchroton radiation to spot sizes in the sub-micrometer range and, at the same time, achieve a separation of zero and first order light. Reflecting optics, in particular reflecting photon sieves, fulfil these requirements. In this work an analytical model [1-2] has been extended to describe the intensity distribution in the focal plane for reflective geometry. This opens up the possibility to calculate the intensity distribution for a large section of the focal plane and a volume around the focus. A variety of different effects have been simulated, such as chromatic aberration and off-axes source positions, providing a better understanding for reflective optics. A comparison of simulated and measured focus properties will be presented and discussed. [1] Qing Cao, J. Jahns, J. Opt. Soc. Am. A, 19, 1005 (2002) [2] Qing Cao, J. Jahns, J. Opt. Soc. Am. A, 20, 2387 (2003).