Dresden 2006 – wissenschaftliches Programm
Bereiche | Tage | Auswahl | Suche | Downloads | Hilfe
O: Oberflächenphysik
O 21: Phase transitions
O 21.7: Vortrag
Dienstag, 28. März 2006, 12:45–13:00, WIL C207
Interface melting of ice at deeply buried ice-silicondioxide interfaces investigated with high energy x-ray reflectivity — •Sebastian Schoeder1,2, Simon Engemann1, Harald Reichert1, Helmut Dosch1, Jörg Bilgram3, and Veijo Honkimäki2 — 1Max-Planck-Institut für Metallforschung, Heisenbergstraße 3, D-70569 Stuttgart — 2ESRF, 6 rue Jules Horowitz, F-38000 Grenoble — 3ETH Zürich, Schafmattstr. 16, CH-8093 Zürich
Ice interfaces play a key role in many technological and environmental phenomena. Yet the properties of the ice interface are poorly understood, especially at conditions close to the melting point. It is well established that surface melting occurs at the free ice surface. However only very few and contradictory measurements exist for the melting of ice at buried interfaces. We have investigated the temperature dependence of the structure of ice in contact with silicondioxide by x-ray reflectivity measurements exploiting a high energy x-ray beam from a 3rd generation synchrotron source. The high penetration length of this radiation allows us to investigate interface phenomena through macroscopic amounts of material. We show that interface melting can be observed at the ice - silicondioxide interface for both crystalline and amorphous substrates and give values for the thickness of the quasi-liquid layer.