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O: Oberflächenphysik

O 26: Particles and clusters I

O 26.10: Vortrag

Dienstag, 28. März 2006, 18:00–18:15, WIL A317

Measurement of the size of embedded metal clusters by mass spectrometry, transmission electron microscopy and small angle X-ray scattering — •C. Hendrich¹, L. Favre¹, D. N. Ievlev¹, A. N. Dobrynin¹, P. Lievens¹, K. Temst¹, W. Bras², U. Hörmann³, E. Piscopiello³, and G. Van Tendeloo³ — ¹Laboratorium voor Vaste-Stoffysica en Magnetisme, K.U.Leuven, Leuven, Belgium — ²DUBBLE@ESRF, Netherlands Organisation for Scientific Research (NWO), Grenoble, France — ³Elektonenmicroscopie voor Materiaalonderzoek, Universiteit Antwerpen, Antwerp, Belgium

We investigated ensembles of nanometer sized Au, Co, Er and FePt clusters which were embedded in MgO grown simultaneously on mica substrates. The particles were produced by a laser vaporization source and characterized by time-of-flight mass spectrometry before embedding them into the matrix. The size distribution of the clusters before sample preparation was compared to that obtained by transmission electron microscopy after preparation. These well characterized samples were used for investigations by small angle X-ray scattering (SAXS). By using the Guinier analysis to evaluate the scattering data we could extract the average radii of the embedded clusters. We found a good agreement of this data with the cluster sizes obtained from the mass spectra and with the dimensions determined from the transmission electron micrographs. Furthermore, we also investigated samples which were produced at an elevated substrate temperature and found an increased average cluster radius in the SAXS measurements which we attribute to diffusion and coalescence emerging at higher sample temperatures.