Dresden 2006 – scientific programme
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O: Oberflächenphysik
O 27: Scanning probe techniques II
O 27.1: Talk
Tuesday, March 28, 2006, 15:45–16:00, WIL B321
Towards the analysis of force interactions of atomically defined tip-sample contacts — •Daniel Braun1, Thomas König1, Jens Falter2, André Schirmeisen1,3, Hendrik Hölscher3, Marcus Liebmann4, Udo D. Schwarz2, and Harald Fuchs1,3 — 1Institute of Physics, University of Münster, Münster, Germany — 2Department of Mechanical Engineering, Yale University, New Haven, CT, USA — 3Center for Nanotechnology (CeNTech), University of Münster, Münster, Germany — 4II. Institute of Physics B, RWTH Aachen, Aachen, Germany
In recent years, the atomic force microscope (AFM) has been established as a tool for the imaging of surfaces with atomic resolution. However, a reliable interpretation of the observed atomic-scale contrast is often difficult since the exact structural configuration of the tip apex is generally unknown. A determination of the position of the last atoms of the tip is possible using field ion microscopy (FIM). We have built an AFM for operation at low temperatures and under ultra high vacuum (UHV) conditions based on a design that has previously been published [1]. However, significant changes in the design were necessary as the original design uses silicon cantilevers as force sensors, which are not suited for FIM. Therefore, we implemented a tuning fork as force sensor [2], allowing us to choose an appropriate tip material such as tungsten while maintaining atomic-scale resolution capabilities in AFM mode. First experimental results with both microscopy methods will be presented.
[1] W. Allers et al., Rev. Sci. Instrum. 69, 221 (1998)
[2] F. J. Giessibl, Appl. Phys. Lett. 76 1470 (2000)