Dresden 2006 – scientific programme

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O: Oberflächenphysik

O 27: Scanning probe techniques II

O 27.2: Talk

Tuesday, March 28, 2006, 16:00–16:15, WIL B321

Quantitative analysis of ferroelectric domain imaging with piezoresponse force microscopy* — •Tobias Jungk, Ákos Hoffmann, and Elisabeth Soergel — Institute of Physics, University of Bonn, Wegelerstraße 8, 53115 Bonn, Germany

The contrast mechanism for ferroelectric domain imaging via piezoresponse force microscopy (PFM) is investigated. A novel analysis of PFM measurements is presented which takes into account the background frequency spectrum caused by the experimental setup. Thereby all generally required features of PFM imaging with respect to phasing, amplitude, and frequency dependence are satisfied. This allows, for the first time, a quantitative analysis of the domain contrast which is in good agreement with the expected values for the piezoelectric deformation of the sample. Consequences of the inherent experimental background on the amplitude of the domain contrast (enhancement, nulling, inversion) as well as on the shape and the location of the domain boundaries are discussed.

*Financial support of the DFG (FOR 557) and of the Deutsche Telekom AG is gratefully acknowledged.