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15:45 |
O 27.1 |
Towards the analysis of force interactions of atomically defined tip-sample contacts — •Daniel Braun, Thomas König, Jens Falter, André Schirmeisen, Hendrik Hölscher, Marcus Liebmann, Udo D. Schwarz, and Harald Fuchs
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16:00 |
O 27.2 |
Quantitative analysis of ferroelectric domain imaging with piezoresponse force microscopy* — •Tobias Jungk, Ákos Hoffmann, and Elisabeth Soergel
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16:15 |
O 27.3 |
Measurement and simulation of grain boundaries in thin film solar cell absorbers — •Caspar Leendertz, Ferdinand Streicher, Tobias Eisenbarth, Susanne Siebentritt, Sascha Sadewasser, and Martha Ch. Lux-Steiner
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16:30 |
O 27.4 |
High resolution nc-AFM investigation of the adsorption of PTCDA on ultrathin KBr films — •Christian Loppacher, U. Zerweck, L.M. Eng, S. Gemming, G. Seifert, C. Olbrich, K. Morawetz, and M. Schreiber
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16:45 |
O 27.5 |
Investigation of dissipative interaction between probe and ligand-stabilized clusters by NC-AFM — •Georgeta Radu and Uwe Hartmann
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17:00 |
O 27.6 |
Site-Specific Dynamic Force Spectroscopy on NaCl — •Andre Schirmeisen, Domenique Weiner, and Harald Fuchs
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17:15 |
O 27.7 |
Theoretical Analysis of Q-controlled Dynamic Force Microscopy in Ambient Conditions — •Daniel Ebeling, Hendrik Hölscher, Harald Fuchs, and Udo D. Schwarz
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17:30 |
O 27.8 |
Hydrogen-altered Gd(0001) surfaces investigated by dynamic force microscopy — •Rene Schmidt, Alexander Schwarz, and Roland Wiesendanger
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17:45 |
O 27.9 |
Detection of electrical forces with a capacitive cantilever device — •A.-D. Müller, F. Müller, A. Käppel, and M. Hietschold
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18:00 |
O 27.10 |
Temperature dependence of point-contact friction on silicon — •Lars Jansen, André Schirmeisen, Hendrik Hölscher, and Harald Fuchs
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18:15 |
O 27.11 |
Relating structure and friction: Energy dissipation during the lateral manipulation of antimony nanoparticles — •Markus Heyde, Claudia Ritter, Klaus Rademann, and Udo D. Schwarz
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18:30 |
O 27.12 |
Influence of wettability on microtribological properties of microsystems — •Wolfram Hild, Yonghe Liu, Michael Schuch, Matthias Scherge, and Juergen A. Schaefer
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