Dresden 2006 – wissenschaftliches Programm
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O: Oberflächenphysik
O 29: Poster session II (Nanostructures, Magnetism, Particles and clusters, Scanning probe techniques, Time-resolved spectroscopy, Structure and dynamics, Semiconductor surfaces and interfaces, Oxides and insulators, Solid-liquid interfaces)
O 29.35: Poster
Mittwoch, 29. März 2006, 14:30–17:30, P2
Design of a low temperature Tuning Fork Atomic Force Microscope combined with a Field Ion Microscope — •Thomas König1, Daniel Braun1, Jens Falter2, André Schirmeisen1,3, Hendrik Hölscher3, Marcus Liebmann4, Udo D. Schwarz2, and Harald Fuchs1,3 — 1Institute of Physics, University of Münster, Münster, Germany — 2Department of Mechanical Engineering, Yale University, New Haven, CT, USA — 3Center of Nanotechnology (CeNTech), University of Münster, Münster, Germany — 4Institute of Physics, RWTH-Aachen, Aachen, Germany
The atomic force microscope (AFM) has been established as a tool for the imaging of surfaces with atomic resolution. However, an interpretation of the forces which act between tip and surface atoms is only possible if the exact configuration of the tip apex atoms is known. The last atom layers of the tip can be analyzed by field ion microscopy (FIM). We have built a non-contact mode AFM by implementing a tuning fork as force sensor [1] in a low temperature, ultra high vacuum (UHV) design [2]. This setup allows us to choose an appropriate FIM material, such as tungsten for the tip, while maintaining atomic-scale resolution capabilities. The high stability of the setup has been proven by scanning tunneling microscopy investigations. Furthermore, we present a special home-build transfer design for the tuning fork exchange between the FIM and AFM chambers in the UHV system and first atomic resolution images of tungsten tips with the FIM are shown.
[1] F. J. Giessibl, Appl. Phys. Lett. 76 1470 (2000)
[2] W. Allers et al., Rev. Sci. Instrum. 69, 221 (1998)