Dresden 2006 – wissenschaftliches Programm

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O: Oberflächenphysik

O 29: Poster session II (Nanostructures, Magnetism, Particles and clusters, Scanning probe techniques, Time-resolved spectroscopy, Structure and dynamics, Semiconductor surfaces and interfaces, Oxides and insulators, Solid-liquid interfaces)

O 29.37: Poster

Mittwoch, 29. März 2006, 14:30–17:30, P2

Frequency Modulated Atomic Force Microscopy: Atomic Resolution and Force Spectroscopy — •Georg Simon, Markus Heyde, Hans-Peter Rust, and Hans-Joachim Freund — Fritz-Haber-Institute of the Max-Planck-Society, Faradayweg 4-6, D-14195 Berlin, Germany

Images with atomic resolution by frequency modulated atomic force microscopy (FM-AFM) on different materials have been presented. However, proper descriptions of the tip-sample interaction and contrast mechanisms are still under discussion. The understanding of these issues leads toward new insights of specific surface properties and to an extension of FM-AFM beyond topography measurements. In contrast to the simple relation connecting the static deflection of a cantilever to the interaction force, the corresponding relation for FM-AFM is significantly more complex and depends on both the spring constant and amplitude of oscillation. Here we present an experimental method for quantitative determination of the spring constant and the amplitude oscillation for a double tuning fork sensor operated at low temperature in ultra-high vacuum [1]. The quantitatively characterized measurements will be shown in combination with atomically resolved images.

[1] M. Heyde, M. Kulawik, H.-P. Rust, H.-J. Freund, Rev. Sci. Instrum. 75, 2446 (2004).