Dresden 2006 – scientific programme
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O: Oberflächenphysik
O 29: Poster session II (Nanostructures, Magnetism, Particles and clusters, Scanning probe techniques, Time-resolved spectroscopy, Structure and dynamics, Semiconductor surfaces and interfaces, Oxides and insulators, Solid-liquid interfaces)
O 29.41: Poster
Wednesday, March 29, 2006, 14:30–17:30, P2
Work function differences of C60 on oriented metal surfaces — •Ulrich Zerweck, Christian Loppacher, and Lukas M. Eng — Institute of Applied Photophysics, University of Technology Dresden, 01062 Dresden
Organic semiconductors have gained increased interest with respect to their use in organic light emitting diodes. For the efficient injection of charge carriers from the metal electrodes into the organic semiconductor, a low dipole barrier height is required. Similar to most organic molecules, C60 also shows a linear dependence between the workfunction of the metal substrate and the dipole barrier formed between molecule and substrate. Such evidence stems from macroscopically measurements using UPS [1]. In this work, we compare these findings to microscopic inspections of local barrier heights investigating individual C60 molecules by the use of Kelvin probe force microscopy.
In a previous publication [2] we showed the agreement beween dipole barrier heights aquired with macroscopic UPS on one hand and, on the other hand, quantitative Kelvin probe force microscopy on the nanometer scale. Recently, we were able to push the lateral resolution forward down to ≈10 nm, still beeing quantitative.
[1] I. G. Hill et al., Appl. Phys. Lett 73, 662(1998)
[2] U. Zerweck et al., Phys. Rev. B 71, 125424 (2005)