Dresden 2006 – wissenschaftliches Programm

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O: Oberflächenphysik

O 29: Poster session II (Nanostructures, Magnetism, Particles and clusters, Scanning probe techniques, Time-resolved spectroscopy, Structure and dynamics, Semiconductor surfaces and interfaces, Oxides and insulators, Solid-liquid interfaces)

O 29.48: Poster

Mittwoch, 29. März 2006, 14:30–17:30, P2

A Besocke-type double-probe STM — •Philipp Jaschinsky, Franz-Peter Coenen, Helmut Stollwerk, Gerhard Pirug, and Bert Voigtländer — Institut für Schichten und Grenzflächen (ISG 3), Forschungszentrum Jülich, 52425 Jülich, Germany

A combination of a double-probe scanning tunnelling microscope (STM) with a scanning electron microscope (SEM) in ultrahigh vacuum (UHV) environment is presented. Due to a compact Besocke beetle-type design with two stages it was possible to integrate two independently driven STMs on small space. The positioning of the two tips can be controlled from macroscopic range down to 50 nm by an add-on electron column. This apparatus is a promising tool for manipulation and characterizations of nanostructures on surfaces. The operation and performance of the instrument will be illustrated by several examples.