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O: Oberflächenphysik

O 33: Scanning probe techniques III

O 33.1: Vortrag

Donnerstag, 30. März 2006, 11:15–11:30, PHY C213

Combined Frequency Modulated Atomic Force and Scanning Tunneling Microscope: Basic Concept, Experimental Design, Signal Electronics, Atomic Resolution — •Georg Simon, Markus Heyde, Hans-Peter Rust, and Hans-Joachim Freund — Fritz-Haber-Institute of the Max-Planck-Society, Faradayweg 4-6, D-14195 Berlin, Germany

A low temperature (5 Kelvin) ultra-high vacuum system has been supplemented with a new double tuning fork sensor for frequency modulated atomic force microscopy (FM-AFM) and scanning tunneling microscopy (STM) measurements [1]. Here the experimental set-up of the whole microscope will be presented, e.g. vacuum chamber, vibrational isolation, cryostat, microscope head, force sensor and signal electronics. The combined FM-AFM/STM set-up has been tested successfully. It shows atomic resolution in both modes. For detailed analysis and interpretation of surface structures, we benefit from the capability of our sensor to record FM-AFM and STM images as well as spectroscopic data at the same surface area. Atomically resolved images obtained on thin oxide films will be presented [2].

[1] M. Heyde, M. Kulawik, H.-P. Rust, H.-J. Freund, Rev. Sci. Instrum. 75, 2446 (2004).

[2] M. Heyde, M. Sterrer, H.-P. Rust, H.-J. Freund, Appl. Phys. Lett. 87, 083104 (2005).