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O: Oberflächenphysik

O 34: Particles and clusters II

O 34.1: Vortrag

Donnerstag, 30. März 2006, 11:15–11:30, WIL A317

Supported Ag clusters deposited on insulating substrates studied by reflectance-difference spectroscopy and ellipsometry — •J.M. Flores-Camacho, L.D. Sun, M. Hohage, K. Schmidegg, N. Saucedo-Zeni, G. Weidlinger, and P. Zeppenfeld — Institute of Experimental Physics, Johannes Kepler University Linz, Altenberger str. 69, A4040 Linz, Austria

Metal clusters were formed during the deposition of nominally few nanometer thick Ag layer on insulating substrates, i.e., poly(ethylene terephthalate) (PET) and amorphous quartz. Depending on the cluster size, substrate crystallinity, and substrate dielectric properties, the metal clusters exhibit different plasmon related optical responses with out-of-plane and even in-plane anisotropy. In the case of clusters deposited on biaxially drawn PET substrates, reflectance-difference spectroscopy (RDS) provided a tool for the study of anisotropic plasmon resonances lying in the plane of the substrate. On the other hand, since Ag clusters on amorphous substrates such as quartz do not show in-plane anisotropy, then the out-of-plane anisotropy plays a prominent role in the determination of the cluster properties, therefore, the employment spectroscopic ellipsometry (SE) is proposed to accomplish such a task. This enables us to study plasmon resonances along both parallel and perpendicular directions to the substrate surface normal.