Dresden 2006 – scientific programme

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O: Oberflächenphysik

O 6: Scanning probe techniques I

O 6.1: Talk

Monday, March 27, 2006, 11:15–11:30, WIL B321

Scanning optical nearfield investiagtion of thin metal films — •Maximilian Assig, Kai Hodeck, and Mario Dähne — Institut für Festkörperphysik, Technischen Universität Berlin, D-10623 Berlin

We present a setup to investigate the optical nearfield of thin film samples such as metal films with subwavelength spatial resolution. Simultaneously observing the topography and the luminescence of the sample we are able to correlate structural and optical properties. When illuminating the sample from reverse in total reflection geometry, we are able to probe the near field of the sample either by collection through an etched fiber tip or by scattering with a gold tip. In the latter case, the scattered light is collected in the far field, using distance modulation to detect selectively the scattered nearfield-signal of the sample. We present first results on the nearfield properties of a thin gold film containing nanometer scale holes with two different diameters.