O 6: Scanning probe techniques I
Montag, 27. März 2006, 11:15–13:00, WIL B321
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11:15 |
O 6.1 |
Scanning optical nearfield investiagtion of thin metal films — •Maximilian Assig, Kai Hodeck, and Mario Dähne
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11:30 |
O 6.2 |
Scattering scanning near-field optical microscopy on anisotropic dielectrics using a free electron laser light source — •Susanne Schneider, J. Seidel, S. Grafström, C. Loppacher, M. Cebula, L. M. Eng, S. Winnerl, D. Stehr, and M. Helm
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11:45 |
O 6.3 |
Optical versus mechanical contrast mechanism in dynamic apertureless SNOM — •Ralf Vogelgesang, Alpan Bek, Ruben Esteban, and Klaus Kern
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12:00 |
O 6.4 |
Plasmon propagation through a border between different layered systems observed by SNOM — •Andreas Englisch, Stefan Griesing, and Uwe Hartmann
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12:15 |
O 6.5 |
Nonlinear nano-optics: tip-enhanced spectroscopy based on optical frequency conversion at a metal tip — •Matthias Danckwerts, Michael Beversluis, and Lukas Novotny
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12:30 |
O 6.6 |
Video-rate Scanning Probe Microscopes: solving the problem of resonances induced by the non-linear piezo material. — •G.J.C. van Baarle, W.M. van Spengen, W.A. van Loo, R. Schakel, L. Crama, J.W.M. Fenken, M.J. Rost, and T.H Oosterkamp
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12:45 |
O 6.7 |
Using the Constant-Excitation Mode as a Spectroscopy Tool in Ambient Conditions — •Jan-Erik Schmutz, Marcus Schäfer, and Hendrik Hölscher
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