Bereiche | Tage | Auswahl | Suche | Downloads | Hilfe
TT: Tiefe Temperaturen
TT 26: Transport - Poster Session
TT 26.4: Poster
Mittwoch, 29. März 2006, 14:30–18:30, P1
A Setup to measure the influence of defects on conductance fluctuations in metallic nanowires — •Michael Wolz, Vojko Kunej, Christian Debuschewitz, and Elke Scheer — Fachbereich Physik, Universität Konstanz, D-78457 Konstanz
The goal of the project is to investigate the influence of individual artificial defects on the conductance fluctuation of metallic nanowires. An STM working in a conventional cryostat at 4 K and in magnetic fields up to 1 T has been developed for creating the defects. In order to position the sample with respect to the STM tip the system is equiped with an x-y-table. The nanostructures are fabricated by electron beam lithography and reactive ion etching [1]. The accessibility of the samples by the STM tip is realized by shadow evaporation of the metal (Au) onto the substrate. First low-temperature transport measurements are presented. [1] T. Hoss et al., Physica E 14 (2002) 341