Dresden 2006 – scientific programme

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TT: Tiefe Temperaturen

TT 7: Superconductivity & Solids At Low Temperature - Poster Session

TT 7.10: Poster

Monday, March 27, 2006, 14:00–17:45, P1

TEM cross-section analysis of La₂Zr₂O₇ buffer layers for YBCO-coated conductors prepared by chemical solution deposition — •Leopoldo Molina¹, Sebastian Engel², Kerstin Knoth², Bernhard Holzapfel², and Oliver Eibl¹ — ¹Institute of Applied Physics, University of Tuebingen, Auf der Morgenstelle 10, D-72076 Tuebingen, Germany — ²IFW Dresden, Leibniz Institute for Solid State and Materials Research Dresden, Helmholtzstr. 20, D-01069 Dresden, Germany

Chemical solution deposition is a promising method to fabricate low cost buffer layers for YBCO-coated conductors. In this study we present transmission electron microscopy (TEM) analysis of cross-sectional and plan-view prepared La₂Zr₂O₇ buffer layers on biaxially textured Ni-W substrates for YBCO-coated conductors prepared by chemical solution deposition methods. The La₂Zr₂O₇ buffer layers were deposited on 100 µm thick Ni-W substrate and were heat treated at 900^∘C and 1050^∘C. TEM cross-section samples were prepared by conventional mechanical polishing and ion milling techniques. By means of transmission electron microscopy the grain size, the buffer layer thickness, the void size and void density and the orientation of LZO with respect to the Ni substrate was determined. The Ni-W substrate interface with the La₂Zr₂O₇ buffer layer was also investigated. Using two-beam imaging conditions bright-field, dark-field and energy spectroscopic images (ESI) were acquired. Chemical composition determination of the films and substrate was done by energy dispersive X-ray microanalysis (EDX).