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TT: Tiefe Temperaturen
TT 7: Superconductivity & Solids At Low Temperature - Poster Session
TT 7.50: Poster
Montag, 27. März 2006, 14:00–17:45, P1
Current and phase distribution in Josephson junctions with ferromagnetic interlayer — •Martin Weides1, Dietmar Doenitz2, Hermann Kohlstedt1,3, Dieter Koelle2, and Reinhold Kleiner2 — 1Institute for Solid State Research, Research Centre Juelich, Germany — 2Physikalisches Institut - Experimentalphysik II, Universität Tübingen — 3Department of Material Science and Department of Physics, University of Berkeley, USA
We use Low Temperature Scanning Electron
Microscopy (LTSEM) to image current and phase distribution in
low-TC SINFS Josephson junctions (JJ) with diluted ferromagnetic
Ni60Cu40 used as F-interlayer. Our technology [1]
enables us to fabricate high quality junctions with low parameter
spread. The configuration of magnetic domains in the F-interlayer
is, amongst others, determined by the shape-anisotropy. The in-plane
magnetization forms magnetic domains, which influence Cooper pair
and quasiparticle transport trough the F-interlayer. We use annular
and elliptical junction geometries for this work.
The imaging is
based on the electron-beam-induced local heating of a resistively
biased junction [2]. The beam-induced voltage-change is detected
by Lock-In technique and is proportional to the Josephson current.
The interaction between the local magnetic configuration of the JJ
and
external magnetic fields with respect to the transport current is studied.
[1] Weides et al., to appear in Physica C
[2] R. Gross and D. Koelle, Reports on Progress in Physics 57
(1994)