Dresden 2006 – wissenschaftliches Programm
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VA: Vakuumphysik und Vakuumtechnik
VA 4: Instruments for neutrons
VA 4.3: Vortrag
Montag, 27. März 2006, 15:20–15:40, HSZ 101
Horizontal ToF-Reflectometer REFSANS at FRM-II: Potential and First Results — •Reinhard Kampmann1, Martin Haese-Seiller1, Valery Kudryashov1, Bert Nickel2, Christian Daniel3, Wilhelm Fenzl3, Kirstin Seidel2, Andreas Schreyer1, Erich Sackmann3, and Joachim Rädler2 — 1Institut für Werkstoffforschung, GKSS-Forschungszentrum Geesthacht GmbH, D-21502 Geesthacht, Germany — 2Lehrstuhl für Experimentelle Physik/Biophysik, Sektion Physik, Ludwig-Maximilians-Universität, Geschwister-Scholl Platz 1, D-80539 München, Germany — 3Physik-Department E22, Technical University Munich, 85748 Garching, Germany
The reflectometer REFSANS allows the performce of comprehensive analyses of vertical and lateral surface and interface structures by means of specular and off-specular neutron reflectivity as well as small-angle neutron scattering at grazing incidence (GISANS). All measurements can be performed on air-water interfaces with horizontally aligned samples. This is achieved by a novel ToF- and neutron optical design of the instrument that allows settings of very different scattering geometries and resolutions. The performance of REFSANS will be discussed with relation to the minimum specular reflectivity achievable both for a strongly and a weekly incoherently scattering substrate. Furthermore, the potential of REFSANS for the investigation of laterally structured surfaces by means of GISANS is presented. REFSANS can optionally be operated with polarized neutrons including polarization analysis (3He-filter) from autumn 2006.