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A: Atomphysik

A 8: Poster I: Pr
äzisionsspektroskopie

A 8.16: Poster

Tuesday, March 14, 2006, 16:30–18:30, Labsaal

VUV spectroscopy from TESLA-EBIT — •G. Başak Balli, Sascha Epp, José R. Crespo López-Urrutia, and Joachim Ullrich — Max-Planck-Institut für Kernphysik Saupfercheckweg 1, D-69117 Heidelberg, Germany

An electron beam ion trap (TESLA-EBIT) will be installed in the new free electron laser (FEL) beam line at the TESLA facility in Hamburg. A soft x-ray flat-field grazing-incidence grating spectrometer has been recently implemented to the EBIT. This spectrometer is equipped with a cryogenically cooled back-illuminated charge-coupled device (CCD) camera. It has a 2400 grooves/mm grating which spectral region varies from 1 to 5 nm (VUV). Preliminary results of K-shell lines in hydrogenlike and heliumlike O, N, and C ions are presented here. The differences between a monoenergetic and a Maxwellian-like electron beam will also be studied for the L-shell transitions in highly charged Ar ions.