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Frankfurt 2006 – scientific programme

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Q: Quantenoptik und Photonik

Q 31: Poster Fallen und Kühlung

Q 31.6: Poster

Tuesday, March 14, 2006, 16:30–18:30, Labsaal

Fabrication and Characterisation of semiconducting Atom Chips — •Soenke Groth1, Joerg Schmiedmayer1, and Israel Bar-Joseph21Universitaet Heidelberg, Germany — 2Weizmann Insitute of Science, Israel

Due to our fabrication process we managed to combine standard metal wire Atom Chips with semiconducting samples. This enables to trap atoms with non metal wires. The new Atom Chip is a combination of the well known technique of Atom Chips, and a new part, which is fabricated from a semiconductor. Different techniques are required to produce this element and to impelment it onto the Atom Chip. Fabrication and characterisation of these chips are demonstrated. Further more the characterisation of e-beam patterned Atom Chips is shown.

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