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Q: Quantenoptik und Photonik

Q 35: Poster Photonische Kristalle

Q 35.12: Poster

Tuesday, March 14, 2006, 16:30–18:30, Labsaal

Properties of Low Refractive Index Supports Made of Mesoporous Silica — •Denan Konjhodzic, Helmut Bretinger, and Frank Marlow — Max-Planck-Institut für Kohlenforschung, D-45470 Mülheim an der Ruhr

Mesoporous silica thin films were synthesized by dip-coating in evaporation-induced self-assembly process. In this modified sol-gel process a nonionic triblock copolymer has been used as a template. The formed structure depends strongly on the processing conditions, especially humidity. Film thickness can be tuned by drawing rate. The structures of two different types of films were investigated by small angle x-ray scattering, transmission electron microscopy and atomic force microscopy [1]. Low humidity allows reproducible synthesis of low refractive index films, which were used as optical waveguide supports.

Here we investigate the influence of processing parameters on their optical properties. Refractive index, birefringence and film thickness were determined by angular-dependent interferometry. Porosity can be determined from refractive index applying different effective media models. The film scattering was characterized in the visible spectral range.

In another sol-gel process very transparent PZT films were synthesized and deposited onto mesoporous films. The compatibility of these films with mesoporous supports is investigated.

[1] D. Konjhodzic, H. Bretinger, U. Wilczok, A. Dreier, A. Ladenburger, M. Schmidt, M. Eich, F. Marlow, Appl. Phys. A 81 (2005) 425