DS 13: Thin Film Analytics II
Dienstag, 27. März 2007, 15:15–16:30, H34
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15:15 |
DS 13.1 |
Measurement of oxide layers with laser-assisted atom probe tomography (LA-TAP) — •Christian Oberdorfer, Carsten Nowak, Christoph Reinke, Patrick Stender, and Guido Schmitz
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15:30 |
DS 13.2 |
Low-level hydrogen profiling with RNRA — •Johannes Bosman, Michael Uhrmacher, Holger Schebela, Carsten Ronning, and Hans Hofsäß
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15:45 |
DS 13.3 |
High resolution Rutherford backscattering spectrometry for investigating interdiffusion of thin films — •Christian Borschel, Martin Schnell, Michael Uhrmacher, Carsten Ronning, Christian Wenger, and Hans Hofsäss
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16:00 |
DS 13.4 |
Elemental Characterisation of Mn-, Mg- an Co- doped ZnO nanostructures — •Christoph Meinecke, Andreas Rahm, Jürgen Vogt, and Tilman Butz
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16:15 |
DS 13.5 |
The reflectometer ADAM at ILL - Perspectives for an angle dispersive instrument — •Max Wolff, Kyrill Zhernenkov, and Hartmut Zabel
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