DS 14: Thin Film Analytics III
Tuesday, March 27, 2007, 16:45–18:00, H34
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16:45 |
DS 14.1 |
Non-destructive speciation of deeply buried TiOx nanolayers and their interfaces — •Beatrix Pollakowski, Burkhard Beckhoff, Stefan Braun, Peter Gawlitza, Falk Reinhardt, and Gerhard Ulm
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17:00 |
DS 14.2 |
Self assemblied Ge nanocrystals on high-k cubic Pr2O3(111) /Si(111) support systems — •Alessandro Giussani, Thomas Schroeder, Cristian Mokuta, Till Metzger, Dorin Geiger, Peter Formanek, and Hannes Lichte
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17:15 |
DS 14.3 |
Beitrag wurde abgesagt — •XXX XXX
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17:30 |
DS 14.4 |
Gitteranpassung von kristallinen, SE-dotierten PLD-Schichten am Beispiel YVO4 — •Bilge Ileri, Günter Huber und Sebastian Bär
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17:45 |
DS 14.5 |
Characterization of GdScO3 layers by Spectroscopic Ellipsometry — Martin Roeckerath, •Jürgen Moers, Jürgen Schubert, and Siegfried Mantl
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