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DS: Fachverband Dünne Schichten

DS 15: Poster Session

DS 15.34: Poster

Dienstag, 27. März 2007, 15:00–17:00, Poster B

Adhesion energy measurements by means of white-light microscopy and controlled-buckling technique — •Eugen Nikitin, Astrid Pundt, and Reiner Kirchheim — Institut für Materialphysik, Friedrich-Hund-Platz 1, 37077 Göttingen

Adhesion energies determine the attachment of different materials to each other and therefore, are rather important for multi-material stack designs. However, there is a lack of data in this field and existing data vary from each other depending on the method. This can be usually attributed to plastic deformation which accompanies the measurement process. In this contribution, two methods were used to determine adhesion energies between an adhering film (Nb) and a rigid substrate (PC). Both methods use film buckling upon mechanical stress to calculate the adhesion energy. For the first method, applying the theory of Gille and Rau, the cross-sectional buckle-morphologies of straight sided buckles were measured by using a white-light interferometer. The second method, the controlled-buckling-technique, uses the critical hydrogen concentration above which film buckling sets in.[1-2] It will be shown that the two methods give similar results. But, it results also, that the Gille-and-Rau-method is very sensitive to shape variations occurring from local plastic deformations. [1] A. Pundt, P. Pekarsky, *Buckling of thin Nb-films on polycarbonate substrates upon hydrogen loading* Scripta Mat. 48 (2003) 419-423. [2] A. Pundt, E. Nikitin, P. Pekarsky, R. Kirchheim, *Adhesion energy between metal films and polymers obtained by studying the buckling of the film*, Acta Mater. 52 (2004) 1579-1587.