DS 17: Contact Properties (SYOE 10)
Wednesday, March 28, 2007, 16:45–18:45, H32
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16:45 |
DS 17.1 |
Invited Talk:
Single grain contacts — •Gregor Witte
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17:30 |
DS 17.2 |
Comparison of the charge injection barrier at realistic and ideal metal/organic interfaces: metals become faceless — •Mandy Grobosch and Martin Knupfer
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17:45 |
DS 17.3 |
Influence of film thickness on contact resistance in nanoscale oligothiophene field effect transistors — •Arne Hoppe, Torsten Balster, Günther Götz, Peter Bäuerle, and Veit Wagner
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18:00 |
DS 17.4 |
Electrode - molecular semiconductor contacts: work-function-dependent hole injection barriers versus Fermi-level pinning — •Norbert Koch and Antje Vollmer
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18:15 |
DS 17.5 |
Structure and growth of organic-organic heterojunctions elucidated by in-situ X-ray diffraction studies — •Esther Barrena, Dimas G. de Oteyza, Jusep Ossó, Stefan Sellner, and Helmut Dosch
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18:30 |
DS 17.6 |
Fabrication and temperature-dependent conductivity studies of conducting polymer nanowires — J.H. Franke, B. Dong, H. Fuchs, and •L. Chi
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