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DS: Fachverband Dünne Schichten

DS 21: Symposium: Real Time Growth Studies II

DS 21.1: Hauptvortrag

Donnerstag, 29. März 2007, 11:15–12:00, H32

Growth morphology evolution in real time and real space — •Joachim Krug — Institut für Theoretische Physik, Universität zu Köln, Zülpicher Strasse 77, 50937 Köln, Germany

Understanding morphology evolution during thin film growth requires the combination of real time probes, which provide information about the layer coverage distribution and derived quantities such as the surface roughness, and real space imaging which gives insight into the lateral (regular or irregular) structure. The talk will summarize the state of the art that has been achieved in the study of simple model systems, such as homoepitaxial metal films. Starting from the statistical growth limit, where interlayer transport is completely suppressed, we will sketch the quantitative theory of mound formation based on the analysis of nucleation of new layers. We will discuss the relevance of this mechanism for organic thin film growth, and argue that information on the possible suppression of interlayer transport in these systems can be obtained from the shapes of growth spirals. Stochastic roughening mechanisms giving rise to self-affine morphologies will then be briefly reviewed, and the phenomenon of rapid roughening in organic films, where roughness builds up faster than in the statistical growth limit, will be discussed in the context of available theories.